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Chen, S. - Y., & Lei, P. - W..  (2005).  Controlling item exposure and test overlap in computerized adaptive testing. Applied Psychological Measurement, 29, 204-217.

Chen, S. - Y., Ankenmann, R. D., & Spray, J. A..  (2003).  The relationship between item exposure and test overlap in computerized adaptive testing. Journal of Educational Measurement, 40, 129-145.

Chen, S. - Y., Ankenmann, R. D., & Chang, H. - H..  (2000).  A comparison of item selection rules at the early stages of computerized adaptive testing. Applied Psychological Measurement, 24, 241-255.