Bibliography

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Filters: Author is Lei, Pui-Wa  [Clear All Filters]
2005
Chen, S. - Y., & Lei, P. - W.. (2005). Controlling Item Exposure and Test Overlap in Computerized Adaptive Testing. Applied Psychological Measurement, 29, 204-217. doi:10.1177/0146621604271495
2006
Lei, P. - W., Chen, S. - Y., & Yu, L.. (2006). Comparing Methods of Assessing Differential Item Functioning in a Computerized Adaptive Testing Environment. Journal of Educational Measurement, 43, 245–264. doi:10.1111/j.1745-3984.2006.00015.x
2014
Chen, S. - Y., Lei, P. - W., Chen, J. - H., & Liu, T. - C.. (2014). General Test Overlap Control: Improved Algorithm for CAT and CCT. Applied Psychological Measurement, 38, 229-244. doi:10.1177/0146621613513494