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Chen, S. - Y., Ankenmann, R. D., & Spray, J. A.. (2003). The relationship between item exposure and test overlap in computerized adaptive testing. Journal of Educational Measurement, 40, 129-145.

Chen, S. - Y., Ankenmann, R. D., & Spray, J. A.. (2003). The relationship between item exposure and test overlap in computerized adaptive testing. Journal of Educational Measurement, 40, 129-145.

Chen, S. - Y., Ankenmann, R. D., & Spray, J. A.. (2003). The relationship between item exposure and test overlap in computerized adaptive testing. Journal of Educational Measurement, 40, 129-145.