Export 3 results:
Filters: First Letter Of Title is E and Author is Ankenmann, R. D. [Clear All Filters]
Exploring the relationship between item exposure rate and test overlap rate in computerized adaptive testing. Paper presented at the annual meeting of the National Council on Measurement in Education, Montreal, Canada.
. (1999). Effects of practical constraints on item selection rules at the early stages of computerized adaptive testing. Journal of Educational Measurement, 41, 149-174.
. (2004).