Controlling item exposure and test overlap in computerized adaptive testing

Submitted by on Mon, 08/01/2011 - 15:05
TitleControlling item exposure and test overlap in computerized adaptive testing
Publication TypeJournal Article
Year of Publication2005
AuthorsChen, SY, Lei, PW
JournalApplied Psychological Measurement
Volume29(2)
Pagination204–217
Publication Languageeng