Submitted by daveweiss on Fri, 08/26/2011 - 14:53
| Title | Effects of test administration mode on item parameter estimates |
| Publication Type | Conference Paper |
| Year of Publication | 2003 |
| Authors | Yi, Q, Harris, DJ, Wang, T, Ban, J-C |
| Conference Name | Paper presented at the annual meeting of the National Council on Measurement in Education |
| Conference Location | Chicago IL |
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