Submitted by daveweiss on Mon, 08/01/2011 - 15:05
| Title | The relationship between item exposure and test overlap in computerized adaptive testing |
| Publication Type | Journal Article |
| Year of Publication | 2003 |
| Authors | Chen, S, Ankenmann, RD, Spray, JA |
| Journal | Journal of Educational Measurement |
| Volume | 40 |
| Pagination | 129-145 |
| Publication Language | eng |