Submitted by daveweiss on Thu, 08/25/2011 - 16:21
| Title | Test development exposure control for adaptive testing |
| Publication Type | Conference Paper |
| Year of Publication | 1998 |
| Authors | Parshall, CG, Davey, T, Nering, ML |
| Conference Name | Paper presented at the annual meeting of the National Council on Measurement in Education |
| Conference Location | San Diego, CA |